【獲證專利公告】恭賀! 材光系蘇威宏副教授及團隊之研究成果「利用條紋投影量測透明物體的系統」獲得美國發明專利!
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發明人 |
蘇威宏副教授 |
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系所 |
材光系 |
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專利名稱 |
利用條紋投影量測透明物體的系統 |
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證書號 |
US9,958,262B2 |
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公告日期 |
107年5月1日 |
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專利摘要 |
A system for measuring the profile or the refractive index of a transparent object by fringe projection techniques is provided and has an image generating device, an image capture device, and an image processor. The image generating device produces a reference image with a long depth of focus. This reference image is emitted into an inspected transparent object, and is distorted by the refractive index and the profile of the transparent object. The image capture device receives the distorted image. The image processor analyzes the difference between the distorted image and the reference image, so as to identify the profile or the refractive index of the inspected transparent object.
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技轉服務窗口 |
莊淨智(分機2625) |
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