【獲證專利公告】恭賀! 材光系蘇威宏副教授及團隊之研究成果「光滑物體的量測系統及其量測方法」獲得美國發明專利!
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發明人 |
蘇威宏副教授 |
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系所 |
材光系 |
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專利名稱 |
光滑物體的量測系統及其量測方法 |
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證書號 |
US9,824,452B2 |
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公告日期 |
106年11月21日 |
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專利摘要 |
A topographical measurement system of a specular object and a topographical measurement method thereof are disclosed. The topographical measurement system has a screen, an image capturing device, and an image processing device. The specular object reflects a fringe pattern from the screen, so as to form a virtual image of the fringe pattern. The virtual image is therefore analyzed to obtain a surface profile of the specular object.
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技轉服務窗口 |
莊淨智(分機2625) |
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