【獲證專利公告】恭賀!材光系蘇威宏教授及團隊之研究成果「利用條紋投影量測光滑物體的方法」獲得美國發明專利!
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發明人 |
蘇威宏教授 |
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系所 |
材光系 |
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專利名稱 |
利用條紋投影量測光滑物體的方法 |
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證書號 |
US9,739,602B2 |
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公告日期 |
106年8月22日 |
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專利摘要 |
A method using fringe projection to describe the three-dimensional profile of a specular object is presented and has steps of: providing a diffraction grating formed by exposing and developing a hologram and having at least two sets of interference fringes; guiding a conjugate of the reference light generated from a conjugate light source to pass through the diffraction grating, in order to generate a real image with a long depth of field, a wide convergent angle, and a sinusoidal distribution light intensity; projecting this real image onto an inspected specular object; using an image capture device to capture the intensity distribution of the real image on the inspected specular object so as to obtain an image signal; and using an image processor to analyze the image signal so as to identify the profile of the inspected specular object.
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技轉服務窗口 |
曾溫仁(分機2621) |
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